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Microwave Imaging Expert

June 22, 2016

Microwave Imaging Expert at Sandia Labs Honored as SPIE Fellow for Radar Work

ALBUQUERQUE, N.M. — Sandia National Laboratories researcher Armin Doerry has been named a SPIE fellow for his technical achievements in imaging microwave radar technology development, design and analysis. Doerry is one of 32 new fellows honored this year by SPIE, an international society for optics and photonics established in 1955 as the Society for Photo-Optical